Trojman L, Pantisano L, Bustamante J, Navarro S. EOT sub-nanometric and degradation of mobility: moving towards a physical limit with modern manufacturing techniques?. ACI Av. Cienc. Ing. (Quito) [Internet]. 2010 Jun. 1 [cited 2026 Apr. 22];2(2). Available from: https://revistas.usfq.edu.ec/index.php/avances/article/view/35