TROJMAN, Lionel; PANTISANO, Luigi; BUSTAMANTE, José; NAVARRO, Santiago. EOT sub-nanometric and degradation of mobility: moving towards a physical limit with modern manufacturing techniques?. ACI Avances en Ciencias e Ingenierías, [S. l.], v. 2, n. 2, 2010. DOI: 10.18272/aci.v2i2.35. Disponível em: https://revistas.usfq.edu.ec/index.php/avances/article/view/35. Acesso em: 22 apr. 2026.